μinch/s
|
μm/s
|
dB |
·Steel structure
·Concrete base mounted
|
·1~5 ton
·5-10ton
·10-30ton
·30-100ton etc. |
·L2~4m
·w2~3.5m
·H0.5~2m
&2~3m
|
VC-A
|
2000
|
50 |
66 |
8 |
Adequate in most instances for optical microscopes to 400x,microbalances,optical balances, proximity and projection aligners, etc.
|
VC-B
|
1000 |
25 |
60 |
3 |
Appropriate for inspection and lithography equipment (including steppers) to 3μm line widths
|
VC-C
|
500 |
12.5 |
54 |
1 |
Appropriate standard for optical microscopes to 1000x,lithography and inspection equipment (including moderately sensitive electron microscopes) to 1μm detail size, TFT-LCD stepper/scanner processes
|
VC-D
|
250 |
6 |
48 |
0.3 |
Suitable in most instances for demanding equipment, including many electron microscopes (SEMs and TEMs) and E-Beam systems.
|
VC-E
|
125 |
3 |
42 |
0.1 |
A challenging criterion to achieve. Assumed to be adequate for the most demanding of sensitive systems including long path, aser-based, small target systems, E-Beam lithography systems working at nanometer scales, and other systems requiring extraordinary dynamic stability.
|